Akrometrix平整度测试仪CXP 平面度测量/加热翘曲测量
Akrometrix平整度测试仪与cores平整度测试仪在加热翘曲测量时的对比
前处理 自动化程度 定制 报告速度 报告形式
Akrometrix 需要 低 主要以定制形式 一般 较少
cores 不需要 高 一般不需要定制 自动化 4D视频+PDF等
比Akrometrix更具自动化的cores平整度测试仪优点
测量无需前处理
cores不需要给测量面涂喷剂或其他前处理,省时省力,避免因前处理产生的数据差异
高标准的报告
cores用3D整面快速连续测量替代点与部分测量,结合温度变化,记录成4D影像,作动静态报告
模拟回流焊
利用与实际回流环境相近的双向热风对流加热方式,同时辐射加热,重现真实的回流环境,
3D + 温度 = 4D
运用3D技术+温度技术,测量、观察样品加热时的形状变化,并制作成4D
快速获取测量结果
不需要前处理,从加热到输出报告的全过程都能参数化管理,实时自动化,使测试变得更简单
Akrometrix平整度测试仪cxp cost有效热变形的测量工具
CXP(对流可扩展平台)是一种低成本的、独立的设备主要针对EMS,PCB工厂,插座/连接器市场。CXP采用数字条纹投影技术和5微米的测量分辨率测量视场64x48mm。该解决方案适合特别好的不连续表面的应用,如插座,连接器,和带土样品。CXP使用Akrometrix thermoiré平台运行相同的软件工作室。
CXP采用加热和冷却对流烤箱,Akrometrix包括用于DFP测量2MP相机和投影仪。CXP炉可容纳样品到125x125mm大小和视图的64x48mm场周围查看全炉领域活动通过滑动门。
CXP提供成本有效的解决方案,Akrometrix为客户寻找坚持IPC 9641行业标准关于测量局部板翘曲。
CXP可用于实验室:
故障/缺陷分析
质量保证/质量控制
Akrometrix通过接口分析软件的连接接口之间的形状匹配
材料与设计选择
有限元模型的验证
Akrometrix平整度测试仪cxp相关产品
CORES 平面度测量/平整度测试/加热翘曲测量
core9012a/core9031a/core9032a/core9037a/core9038a/core9045a/core9046a/core9050b/core9055a/core9060a/core9070a/core9100a
Akrometrix平面度测量/平整度测试/加热翘曲测量
AXP-300x233/Convective-Module-Tower/CRE6 Module/CXP/DFP Module/DIC 2.0 Module/Digital Fringe Projection/Digital Image Correlation/Akrometrix Interface Analysis/Akrometrix Part Tracking/PS200S/PS600S/Real Time Analysis/Akrometrix Shadow Moiré/Akrometrix Studio Platform
CXP
CXPCost Effective Thermal Warpage Measurement Tool
The CXP (Convection Expandable Platform) is a low cost, stand alone equipment primarily targeted at the EMS, PCB Fab, and Socket/Connector Markets. The CXP uses the Digital Fringe Projection technique to measure a field of view of 64x48mm with a measurement resolution of 5 microns. The DFP solution fits especially well with discontinuous surface applications, such as sockets, connectors, and balled samples. The CXP use the same Studio software used to run the Akrometrix TherMoiré platforms.
The CXP uses a convection oven for heating and cooling and includes a 2MP camera and projector for DFP measurements. The CXP oven can hold samples up to 125x125mm in size and the 64x48mm field of view is movable around the full oven field of view through a sliding gantry.
The CXP provides a cost effective solution for customers looking to adhere to the IPC 9641 industry standard concerning measuring local board warpage.
The CXP can be used in the laboratory:
Failure/defect analysis
Quality assurance/quality control
Shape matching between attaching interfaces via Interface Analysis Software
Material and Design Choices
FEA Model Validation